A Rapid Learning Model based on Selected Frequency Range Spectral Subtraction for the Data-Driven Fault Diagnosis of Manufacturing Systems
Seungyon Cho (Cho S), Hea-Ryeon Seo (Seo HR), Geonhwi Lee (Lee G), Seung-Kyum Choi (Choi SK), Hae-Jin Choi (Choi HJ)
Int. J. Precis. Eng. Manuf.-Smart Tech.. 2023;1(1):49-62.   Published online 2023 Jan 1     DOI: https://doi.org/10.57062/ijpem-st.2022.0031
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