PublisherDOIYearVolumeIssuePageTitleAuthor(s)Link
International Journal of Precision Engineering and Manufacturing-Smart Technology10.57062/ijpem-st.2022.005920231171-81Surface Assessment of Transparent Glass Plate with Wavelength-Modulated Interferometry and Harmonic Phase-Iterative MethodSungtae Kim, Yangjin Kim, Naohiko Sugita, Mamoru Mitsuishihttp://ijpem-st.org/upload/ijpem-st-2022-0059.pdf, http://ijpem-st.org/journal/view.php?doi=10.57062/ijpem-st.2022.0059, http://ijpem-st.org/upload/ijpem-st-2022-0059.pdf
Optical Review10.1007/s10043-012-0038-22012194247-253Simultaneous measurement of surface shape and absolute optical thickness of a glass plate by wavelength tuning phase-shifting interferometryKenichi Hibino, Yangjin Kim, Sangyu Lee, Yohan Kondo, Naohiko Sugita, Mamoru Mitsuishihttp://link.springer.com/content/pdf/10.1007/s10043-012-0038-2.pdf, http://link.springer.com/article/10.1007/s10043-012-0038-2/fulltext.html, http://link.springer.com/content/pdf/10.1007/s10043-012-0038-2
Optik10.1016/j.ijleo.2013.01.1152013124214693-4696Multiple-surface interference fringes analysis basing on wavelength-modulated phase shifting interferometryXu Liu, Li Ma, Huan Ren, Bo Chen, Liqun Chai, Wanguo Zhenghttps://api.elsevier.com/content/article/PII:S0030402613007420?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:S0030402613007420?httpAccept=text/plain
Optics Communications10.1016/j.optcom.2012.10.005201328928-32Enhanced sensitivity to surface plasmon resonance phase in wavelength-modulated heterodyne interferometryJu-Yi Lee, Li-Wei Mai, Cheng-Chih Hsu, Yuan-Yuan Sunghttps://api.elsevier.com/content/article/PII:S0030401812011157?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:S0030401812011157?httpAccept=text/plain
Surface Science10.1016/0039-6028(77)90416-21977661357-360Experimental determination of the complex fresnel reflection coefficient of a three-phase system by combination of modulated reflectance spectroscopy and modulated interferometryhttps://api.elsevier.com/content/article/PII:0039602877904162?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:0039602877904162?httpAccept=text/plain
Optics and Lasers in Engineering10.1016/j.optlaseng.2018.02.007201810639-46A novel dual-wavelength iterative method for generalized dual-wavelength phase-shifting interferometry with second-order harmonicsXiaoqing Xu, Yawei Wang, Ying Ji, Yuanyuan Xu, Ming Xie, Hao Hanhttps://api.elsevier.com/content/article/PII:S0143816618300885?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:S0143816618300885?httpAccept=text/plain
Optics and Lasers in Engineering10.1016/j.optlaseng.2023.1074762023163107476Wavelength-shifting interferometry using the frequency-modulated Chirp-Z transform and effective multi-harmonic samplingLin Chang, Bing Li, Yulan Wei, Yingjie Yuhttps://api.elsevier.com/content/article/PII:S0143816623000052?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:S0143816623000052?httpAccept=text/plain
Optics and Lasers in Engineering10.1016/j.optlaseng.2016.06.021201686309-316Error-compensating phase-shifting algorithm for surface shape measurement of transparent plate using wavelength-tuning Fizeau interferometerYangjin Kim, Kenichi Hibino, Naohiko Sugita, Mamoru Mitsuishihttps://api.elsevier.com/content/article/PII:S0143816616301270?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:S0143816616301270?httpAccept=text/plain
Measurement10.1016/j.measurement.2020.1078702020161107870Thickness profiling of transparent plate using wavelength-tuned phase-shifting analysisYangjin Kim, Younghoon Moon, Kenichi Hibino, Mamoru Mitsuishihttps://api.elsevier.com/content/article/PII:S0263224120304085?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:S0263224120304085?httpAccept=text/plain
Measurement10.1016/j.measurement.2022.1121572022205112157Wavelength-tuning phase-shifting interferometry of transparent plates using sub-signal frequency correctionLin Chang, Yingjie Yuhttps://api.elsevier.com/content/article/PII:S0263224122013537?httpAccept=text/xml, https://api.elsevier.com/content/article/PII:S0263224122013537?httpAccept=text/plain